FIT 2
FIT 2 : An acronym for "Failure In Time" or "Failure unIT," a unit used to express the expected failure rates of semiconductors or other electronic components. One FIT is equal to a rate of one failure per U.S. billion (109) hours, that is, 1 FIT = 10-9/h. Since 109?hours equals about 114 thousand years, these failure rates are estimated from accelerated test procedures using various statistical techniques
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